The Contamination Monitor (CM) was specially developed to detect organic disturbing substances on the paper web of high-speed paper machines non-contact using NIR camera technology and to record their temporal fluctuation over longer periods of time. 

In its current configuration, the proportion of organic load (impurities) can be recorded on a 60 cm wide measuring range with a high measurement repetition rate. The system can be flexibly installed at various positions above the paper web on the paper machine. In addition to the inspection of paper webs, other areas of application are possible, e.g. inspections of plastic films or nonwovens.